SDLE Research Center Publications | Case School of Engineering

Wednesday, January 1, 1997

Struktur der 3(111) Kippkorngrenze in Strontiumtitanat

Kienzle, O., Ernst, F., & Rühle, M. (1997). Struktur der 3(111) Kippkorngrenze in Strontiumtitanat. DGM-Informationsgesellschaft mbH.

Wednesday, January 1, 1997

Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy

Ernst, F., Kienzle, O., & Exner, M. (1997). Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy. , 466 , 95–106.

Wednesday, January 1, 1997

Analysis of Interface Structures by Quantitative HRTEM

Kienzle, O., & Ernst, F. (1997). Analysis of Interface Structures by Quantitative HRTEM. Journal of Computer-Assisted Microscopy, 9 , 13–15.

Wednesday, January 1, 1997

Atomistische Struktur von Korngrenzen in -Al2O3

Gemming, T., Ernst, F., & Rühle, M. (1997). Atomistische Struktur von Korngrenzen in -Al2O3. DGM-Informationsgesellschaft mbH.

Wednesday, January 1, 1997

Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate

Kienzle, O., & Ernst, F. (1997). Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate. Journal of the American Ceramic Society, 80 , 1639–1644.

Tuesday, December 31, 1996

Materials Screening for Attenuating Embedded {Phase-Shift} Photoblanks for {DUV} and 193 nm Photolithography

French, R. H. (1996). Materials Screening for Attenuating Embedded {Phase-Shift} Photoblanks for {DUV} and 193 nm Photolithography. SPIE.

Friday, November 15, 1996

First-principles investigation of the optical properties of crystalline poly(di-n-hexylsilane)

French, R. H., & Xu, Y. H. (1996). First-principles investigation of the optical properties of crystalline poly(di-n-hexylsilane). Physical Review B, 54 (19), 13546-13550.

Thursday, August 1, 1996

High-Voltage Atomic Resolution Microscopy with the Stuttgart ARM1250

Phillipp, F., & Ernst, F. (1996). High-Voltage Atomic Resolution Microscopy with the Stuttgart ARM1250. .

Thursday, August 1, 1996

Quantitative HRTEM of the 3(111) Grain Boundary in Strontium Titanate

Kienzle, O., Ernst, F., & Rühle, M. (1996). Quantitative HRTEM of the 3(111) Grain Boundary in Strontium Titanate. .

Wednesday, July 31, 1996

Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy

French, R. H., & Müllejans, H. H. (1996). Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy. Journal of Physics D: Applied Physics, 29 (7), 1751-1760.

Wednesday, July 31, 1996

Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3

French, R. H., & Mo, S. H. (1996). Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3. Journal of Physics D: Applied Physics, 29 (7), 1761-1766.

Wednesday, July 31, 1996

Critical point analysis of the interband transition strength of electrons

French, R. H., & Xu, Y. H. (1996). Critical point analysis of the interband transition strength of electrons. Journal of Physics D: Applied Physics, 29 (7), 1740-1750.

Friday, May 10, 1996

Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties

French, R. H., Ackler, H. H., & Chiang, Y. H. (1996). Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties. Journal of Colloid and Interface Science, 179 (2), 460-469.

Monday, January 1, 1996

Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons

Dehm, G., Nadarzinski, K., Ernst, F., & Rühle, M. (1996). Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons. Ultramicroscopy, 63 , 49–55.

Monday, January 1, 1996

Structure and Energy of Twin Boundaries in Copper

Ernst, F., Finnis, M., Gust, W., Koch, A., Schmidt, C., & Straumal, B. (1996). Structure and Energy of Twin Boundaries in Copper. Zeitschrift für Metallkunde, 87 , 911–922.

Monday, January 1, 1996

Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung

Dehm, G., Ernst, F., Mayer, J., Mobus, G., Müllejans, H., Phillipp, F., Scheu, C., & Rühle, M. (1996). Transmission Electron Microscopy at the Max-Planck-Institut für Metallforschung. Zeitschrift für Metallkunde, 87 , 898–910.

Monday, January 1, 1996

Untitled on Import

Schmidt, C., Finnis, M., Vitek, V., & Ernst, F. (1996). Untitled on Import. Transtec Publications Ltd..

Monday, January 1, 1996

Quantitative High-Resolution Electron Microscopy of Interfaces

Ernst, F., Hofmann, D., Nadarzinski, K., Stemmer, S., & Streiffer, S. (1996). Quantitative High-Resolution Electron Microscopy of Interfaces. Transtec Publications Ltd..

Monday, January 1, 1996

Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy

Ernst, F., & Rühle, M. (1996). Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy. The Japan Institute of Metals.

Monday, January 1, 1996

On Epitaxy and Orientation Relationship in Physisorption

Pirouz, P., Ikuhara, Y., & Ernst, F. (1996). On Epitaxy and Orientation Relationship in Physisorption. The Japan Institute of Metals.

Monday, January 1, 1996

Quantitative HRTEM of the 3(111) Grain Boundary in NiAl

Nadarzinski, K., & Ernst, F. (1996). Quantitative HRTEM of the 3(111) Grain Boundary in NiAl. Transtec Publications Ltd..

Monday, January 1, 1996

The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy

Nadarzinski, K., & Ernst, F. (1996). The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy. Philosophical Magazine A, 74 , 641–664.

Sunday, December 31, 1995

Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy

French, R. H. (1995). Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy. Materials Research Society.

Monday, May 22, 1995

Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry

French, R. H., Wilson, S. H., Naqvi, S. H., McNeil, J. H., Marchman, H. H., Johs, B. H., & Kalk, F. H. (1995). Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry. SPIE, 2439

Tuesday, January 31, 1995

Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths

French, R. H. (1995). Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths. Solid State Ionics, 75 , 13-33.