Schmidt, C., Finnis, M., Ernst, F., & Vitek, V.(1998).Theoretical and Experimental Investigations of Structures and Energies of 3, [112] Tilt Grain Boundaries in Copper.Philosophical Magazine A,77, 1161–1184.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).C-Induced Ge Dots: A Versatile Tool to Fabricate Ultra-Small Ge Nanostructures.Thin Solid Films,336, 248–251.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
French, R. H., Johnson, R. H., & Thiele, E. H.(1997).Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile {TiO2}.{TAPPI} Journal,80, 233-239.
French, R. H., & Thiele, E. H.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method.Proceedings of the Paint Research Association.
Baither, D., Messerschmidt, U., Baufeld, B., Bartsch, M., & Ernst, F.(1997).In-situ Straining Experiments in HVEM to Study Deformation of Zirconia and NiAl..
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
Kienzle, O., & Ernst, F.(1997).Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate.Journal of the American Ceramic Society,80, 1639–1644.
Schweinfest, R., Gemming, T., Kopold, P., Ernst, F., & Rühle, M.(1997).Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM.European Journal of Cell Biology,74, 78-78.
Ernst, F., & Rühle, M.(1997).Present Developments in High-Resolution Transmission Electron Microscopy.Current Opinion in Solid State & Material Science,2, 469-476.
Nadarzinski, K., Kienzle, O., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.San Francisco Press Inc..
Lyutovich, K., Ernst, F., Banhart, F., Silier, I., Gutjahr, A., & Konuma, M.(1997).Defect Distribution in Compositionally-Graded EpitaxialSiGeLayers on Si Substrates.Inst. Phys. Conf. Ser.,157, 131–134.
Recnik, A., Langjahr, P., & Ernst, F.(1997).Structural Characterization of SrZrO3/SrTiO3 Epitaxial Layers by HRTEM.Journal of Computer-Assisted Microscopy,9, 35–36.
Kienzle, O., Exner, M., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.,466, 95-106.
