Ernst, F., Kienzle, O., & Rühle, M.(1999).Structure and Composition of Grain Boundaries in Ceramics.Journal of the European Ceramic Society,19, 665–673.
Kienzle, O., Ernst, F., Rühle, M., Schmidt, O., & Eberl, K.(1999).Germanium “Quantum Dots” Embedded in Silicon: Quantitative TEM Study of Self-Alignment and Coarsening.Applied Physics Letters,74, 269–271.
Baither, D., Ernst, F., Wagner, T., Rühle, M., Bartsch, M., & Messerschmidt, U.(1999).Micromechanisms of Fracture in NiAl, Studied by in situ HVEM.Intermetallics,9, 479–489.
Han, W., Redlich, P., Ernst, F., & Rühle, M.(1999).Synthesizing Boron Nitride Nanotubes Filled with SiC Nanowires by Using Carbon Nanotubes as Templates.Applied Physics Letters,75, 1875–1877.
French, R. H., Reynolds, G. H., Francis Carcia, P. H., Torardi, C. H., Hughes, G. H., & Jones, D. H.(1998).{TiSi-nitride} attenuating phase-shift photomask for 193 nm lithography.SPIE,3546
French, R. H., Müllejans, H. H., & Jones, D. H.(1998).Dispersion forces and Hamaker constants for intergranular films in silicon nitride from spatially resolved-valence electron energy loss spectrum imaging.Acta Materialia,46(7),2271-2287.
Haalboom, T., Gödecke, T., Ernst, F., Rühle, M., Herberholz, R., Schock, H., Beilharz, C., & Benz, K.(1998).Phase Relations and Microstructure of Bulk Material and Thin Films of the Ternary System Cu–In–Se.IOP Publishing,152 B, 249–252.
Kienzle, O., Exner, M., & Ernst, F.(1998).Atomistic Structure of =3, (111) Grain Boundaries in Strontium Titanate.Physica Status Solidi (a),166, 57–71.
Schmidt, O., Lange, C., Eberl, K., Kienzle, O., & Ernst, F.(1998).Influence of Pre-Grown Carbon on the Formation of Germanium Dots.Thin Solid Films,321, 70–75.
Mader, W., & Ernst, F.(1998).Papers Dedicated To Professor Dr. Manfred Rühle on the Occasion of His 60th Birthday– Preface.Physica Status Solidi A,166(1),5-6.
Schweinfest, R., Ernst, F., Wagner, T., & Rühle, M.(1998).Quantitative HRTEM at the Al/MgAl2O4 Interface: Translation State and Its Reliability.,1, 635-636.
Wöhl, G., Schöllhorn, C., Schmidt, O., Brunner, K., Eberl, K., Kienzle, O., & Ernst, F.(1998).Characterization of Self-Assembled Ge Islands on Si (100) by Atomic Force Microscopy and Transmission Electron Microscopy.Thin Solid Films,321, 86–91.
Kienzle, O., Ernst, F., & Mobus, G.(1998).Reliability of Atom Column Positions in a Ternary System Determined by Quantitative High-Resolution Transmission Electron Microscopy.Journal of Microscopy,190, 144–158.
