Materials Science & Engineering Publications

Thursday, November 1, 1990

Detection of Optically Excited States in {Wide-Band-Gap} Semiconductors with Tunneling Spectroscopy

French, R. H., Rohrer, G. H., & Bonnell, D. H. (1990). Detection of Optically Excited States in {Wide-Band-Gap} Semiconductors with Tunneling Spectroscopy. Journal of the American Ceramic Society, 73 (11), 3257-3263.

Friday, June 15, 1990

Room-temperature optical absorption in undoped {α-Al2O3}

French, R. H. (1990). Room-temperature optical absorption in undoped {α-Al2O3}. Journal of Applied Physics, 67 (12).

Wednesday, April 4, 1990

Laser-plasma sourced, temperature dependent, {VUV} spectrophotometer using dispersive analysis

French, R. H. (1990). Laser-plasma sourced, temperature dependent, {VUV} spectrophotometer using dispersive analysis. IOP Science, 41 (4).

Sunday, April 1, 1990

Temperature dependence of the electronic structure of oxides: {MgO}, {MgAl}

French, R. H. (1990). Temperature dependence of the electronic structure of oxides: {MgO}, {MgAl}. IOP Science, 41 (4).

Thursday, March 1, 1990

Electronic Band Structure of {Al2O3}, with Comparison to Alon and {AIN}

French, R. H. (1990). Electronic Band Structure of {Al2O3}, with Comparison to Alon and {AIN}. Journal of the American Ceramic Society, 73 (3), 477-489.

Monday, January 1, 1990

HRTEM of the Cu/MnO Interface in an Internally Oxidized CuMn Alloy

Ernst, F. (1990). HRTEM of the Cu/MnO Interface in an Internally Oxidized CuMn Alloy. , 183 , 49–55.

Monday, January 1, 1990

A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride

French, R. H. (1990). A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride. .

Monday, January 1, 1990

Electronic Structure and Conductivity of {Al2O3}

French, R. H. (1990). Electronic Structure and Conductivity of {Al2O3}. Journal of the American Ceramic Society.

Monday, January 1, 1990

Structures of Nb/Al2O3 Interfaces Produced by Different Experimental Routes

Mayer, J., Mader, W., Knaus, D., Ernst, F., & Rühle, M. (1990). Structures of Nb/Al2O3 Interfaces Produced by Different Experimental Routes. , 183 , 55–60.

Monday, January 1, 1990

High Resolution Electron Microscopy: Possibilities and Limitations

Pirouz, P., & Ernst, F. (1990). High Resolution Electron Microscopy: Possibilities and Limitations. Pergamon Press.

Monday, January 1, 1990

Automatic Spectral Database and Archive System for Optical Spectroscopy

French, R. H. (1990). Automatic Spectral Database and Archive System for Optical Spectroscopy. Optica Publishing group, 44 (7), 1221-1226.

Monday, November 6, 1989

Optical reflectivity measurements using a laser plasma light source

French, R. H. (1989). Optical reflectivity measurements using a laser plasma light source. Applied Physics, 55 (19).

Thursday, June 1, 1989

Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia

French, R. H., Song, H. H., & Coble, R. H. (1989). Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia. Journal of the American Ceramic Society, 72 (6), 990-994.

Sunday, January 1, 1989

High Resolution Electron Microscopy of an Alumina/Copper Interface

Ernst, F., Pirouz, P., & Heuer, A. H. (1989). High Resolution Electron Microscopy of an Alumina/Copper Interface. , 138 , 557–562.

Sunday, January 1, 1989

Vacuum Ultraviolet Spectroscopy of Ceramics

French, R. H. (1989). Vacuum Ultraviolet Spectroscopy of Ceramics. American Ceramic Society.

Sunday, January 1, 1989

The Formation Mechanism of Planar Defects in Compound Semiconductors Grown Epitaxially on {100} Silicon Substrates

Ernst, F., & Pirouz, P. (1989). The Formation Mechanism of Planar Defects in Compound Semiconductors Grown Epitaxially on {100} Silicon Substrates. Journal of Materials Research, 4 , 834–842.

Sunday, January 1, 1989

Quantitative, {FFT-Based}, {Kramers-Kronig} Analysis for Reflectance Data

French, R. H. (1989). Quantitative, {FFT-Based}, {Kramers-Kronig} Analysis for Reflectance Data. Optica Publishing group, 43 (8), 1498-1501.

Sunday, May 1, 1988

Vacuum ultraviolet, photoemission and theoretical studies of the electronic structure of Al2O3 up to 1000°C

French, R. H. (1988). Vacuum ultraviolet, photoemission and theoretical studies of the electronic structure of Al2O3 up to 1000°C. Elsevier, 150 (1-2), 47-49.

Sunday, May 1, 1988

Summary Abstract: Effect of oxygen incorporation in {AlN} thin films

French, R. H. (1988). Summary Abstract: Effect of oxygen incorporation in {AlN} thin films. Journal of Vacuum Science & Technology A, 6 (3).

Sunday, May 1, 1988

Theoretical and experimental studies on Cu metallization of {Al2O3}

French, R. H., Kasowski, R. H., & Ohuchi, . H. (1988). Theoretical and experimental studies on Cu metallization of {Al2O3}. Elsevier, 150 (1-2), 44-46.

Friday, April 1, 1988

Purity of Aluminum Hydroxide Derived from Triethylaluminum

French, R. H., Tebbe, F. H., Morris, P. H., Chowdhry, U. H., & Coble, R. H. (1988). Purity of Aluminum Hydroxide Derived from Triethylaluminum. Journal of the American Ceramic Society, 71 (4), 204-206.

Friday, January 1, 1988

On the Generation of New Orientations During Recrystallization: Recent Results on the Recrystallization of Tensile Deformed FCC Single Crystals

Berger, A., Wilbrandt, P., Ernst, F., Klement, U., & Haasen, P. (1988). On the Generation of New Orientations During Recrystallization: Recent Results on the Recrystallization of Tensile Deformed FCC Single Crystals. Progress in Materials Science, 32 (1), 1-95.

Friday, January 1, 1988

Materials Science & Engineering Publications

Detection of Optically Excited States in {Wide-Band-Gap} Semiconductors with Tunneling Spectroscopy

Room-temperature optical absorption in undoped {α-Al2O3}

Laser-plasma sourced, temperature dependent, {VUV} spectrophotometer using dispersive analysis

Temperature dependence of the electronic structure of oxides: {MgO}, {MgAl}

Electronic Band Structure of {Al2O3}, with Comparison to Alon and {AIN}

HRTEM of the Cu/MnO Interface in an Internally Oxidized CuMn Alloy

A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride

Electronic Structure and Conductivity of {Al2O3}

Structures of Nb/Al2O3 Interfaces Produced by Different Experimental Routes

High Resolution Electron Microscopy: Possibilities and Limitations

Automatic Spectral Database and Archive System for Optical Spectroscopy

Optical reflectivity measurements using a laser plasma light source

Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia

High Resolution Electron Microscopy of an Alumina/Copper Interface

Vacuum Ultraviolet Spectroscopy of Ceramics

The Formation Mechanism of Planar Defects in Compound Semiconductors Grown Epitaxially on {100} Silicon Substrates

Quantitative, {FFT-Based}, {Kramers-Kronig} Analysis for Reflectance Data

Vacuum ultraviolet, photoemission and theoretical studies of the electronic structure of Al2O3 up to 1000°C

Summary Abstract: Effect of oxygen incorporation in {AlN} thin films

Theoretical and experimental studies on Cu metallization of {Al2O3}

Purity of Aluminum Hydroxide Derived from Triethylaluminum

On the Generation of New Orientations During Recrystallization: Recent Results on the Recrystallization of Tensile Deformed FCC Single Crystals

Heteroepitaxy on (001) Silicon: Growth Mechanisms and Defect Formation

Transmission Electron Microscopy of Composites

Hexagonal Silicon: A New HREM Study