French, R. H., & Mo, S. H.(1996).Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3.Journal of Physics D: Applied Physics,29(7),1761-1766.
French, R. H., & Xu, Y. H.(1996).Critical point analysis of the interband transition strength of electrons.Journal of Physics D: Applied Physics,29(7),1740-1750.
French, R. H., & Müllejans, H. H.(1996).Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy.Journal of Physics D: Applied Physics,29(7),1751-1760.
French, R. H., Ackler, H. H., & Chiang, Y. H.(1996).Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties.Journal of Colloid and Interface Science,179(2),460-469.
Nadarzinski, K., & Ernst, F.(1996).The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy.Philosophical Magazine A,74, 641–664.
Dehm, G., Nadarzinski, K., Ernst, F., & Rühle, M.(1996).Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons.Ultramicroscopy,63, 49–55.
Ernst, F., Finnis, M., Gust, W., Koch, A., Schmidt, C., & Straumal, B.(1996).Structure and Energy of Twin Boundaries in Copper.Zeitschrift für Metallkunde,87, 911–922.
Ernst, F., Hofmann, D., Nadarzinski, K., Stemmer, S., & Streiffer, S.(1996).Quantitative High-Resolution Electron Microscopy of Interfaces.Transtec Publications Ltd..
Ernst, F., & Rühle, M.(1996).Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy.The Japan Institute of Metals.
French, R. H.(1995).Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy.Materials Research Society.
French, R. H., Wilson, S. H., Naqvi, S. H., McNeil, J. H., Marchman, H. H., Johs, B. H., & Kalk, F. H.(1995).Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry.SPIE,2439
French, R. H.(1995). Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths.Solid State Ionics,75, 13-33.
Schmidt, C., Ernst, F., Finnis, M., & Vitek, V.(1995).Prediction and Observation of the BCC Structure in Pure Copper at a Sigma-3 Grain Boundary.Physical Review Letters,75, 2160–2163.
Stemmer, S., Streiffer, S., Ernst, F., Rühle, M., Hsu, W., & Nataraj, R.(1995).Domain Configurations in Ferroelectric PbTiO3 Thin Films: The Influence of Substrate and Film Thickness.Solid State Ionics,75, 43–48.
Stemmer, S., Streiffer, S., Hsu, W., Ernst, F., Nataraj, R., & Rühle, M.(1995).The Influence of Pt and SrTiO3 Interlayers on the Microstructure of PbTiO3 Thin Films Deposited by Laser Ablation on (001)MgO.Journal of Materials Research,10, 791–794.
French, R. H.(1994).Quantitative Electronic Structure Analysis of {a-Al2O3} Using Spatially Resolved Valence Electron {Energy-Loss} Spectra.Mat. Res. Soc. Symp. Proc.
